I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Fatigue Mechanism of Antiferroelectric Hf0.1Zr0.9O2 Toward ..:

Hsiang, K.-Y. ; Lee, J.-Y. ; Lou, Z.-F....
IEEE Transactions on Electron Devices.  70 (2023)  4 - p. 2142-2146 , 2023
Link: https://doi.org/10.1109/ted.2023.3238364