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1 Ergebnisse
1
Gate-Controlled LVTSCR for High-Voltage ESD Protections in ..:
Chen, Ruibo
;
Liu, Hongxia
;
Yan, Cong
...
IEEE Transactions on Electron Devices. 70 (2023) 4 - p. 1566-1573 , 2023
Link:
https://doi.org/10.1109/ted.2023.3244765
RT Journal T1
Gate-Controlled LVTSCR for High-Voltage ESD Protections in Advanced CMOS Processes
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3244765&Exemplar=1&LAN=DE A1 Chen, Ruibo A1 Liu, Hongxia A1 Yan, Cong A1 Du, Feibo A1 Han, Aoran A1 Zhang, Yuxin A1 Huang, Wei A1 Xiang, Qi A1 Gao, Tianzhi A1 Wei, Hao A1 Liu, Zhiwei PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 4 SP 1566 OP 1573 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3244765 DO https://doi.org/10.1109/ted.2023.3244765 SF ELIB - SuUB Bremen
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