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1 Ergebnisse
1
Highly Reliable and Secure PUF Using Resistive Memory Integ..:
Esatu, Tsegereda K.
;
Prakash, Amit
;
Li, Zhi
...
IEEE Transactions on Electron Devices. 70 (2023) 5 - p. 2291-2296 , 2023
Link:
https://doi.org/10.1109/ted.2023.3251953
RT Journal T1 <Title>Highly Reliable and Secure PUF Using Resistive Memory Integrated Into a 28 nm CMOS Process</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3251953&Exemplar=1&LAN=DE A1 Esatu, Tsegereda K. A1 Prakash, Amit A1 Li, Zhi A1 Lau, Derek A1 Jo, Sung Hyun A1 Liu, Tsu-Jae King PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 5 SP 2291 OP 2296 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3251953 DO https://doi.org/10.1109/ted.2023.3251953 SF ELIB - SuUB Bremen
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