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1 Ergebnisse
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Compact Modeling of Impact Ionization in High-Voltage Devic..:
Gill, Garima
;
Singhal, Anant
;
Pahwa, Girish
..
IEEE Transactions on Electron Devices. 70 (2023) 5 - p. 2389-2394 , 2023
Link:
https://doi.org/10.1109/ted.2023.3253101
RT Journal T1 <Title>Compact Modeling of Impact Ionization in High-Voltage Devices</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3253101&Exemplar=1&LAN=DE A1 Gill, Garima A1 Singhal, Anant A1 Pahwa, Girish A1 Hu, Chenming A1 Agarwal, Harshit PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 5 SP 2389 OP 2394 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3253101 DO https://doi.org/10.1109/ted.2023.3253101 SF ELIB - SuUB Bremen
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