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1 Ergebnisse
1
3-D Segmented Gate Concept: A New IGBT Solution for Reduced..:
Deng, Gaoqiang
;
Wang, Jun
;
Wu, Yifan
..
IEEE Transactions on Electron Devices. 70 (2023) 6 - p. 3172-3178 , 2023
Link:
https://doi.org/10.1109/ted.2023.3264529
RT Journal T1 <Title>3-D Segmented Gate Concept: A New IGBT Solution for Reduced Loss and Improved Safe-Operating Area</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3264529&Exemplar=1&LAN=DE A1 Deng, Gaoqiang A1 Wang, Jun A1 Wu, Yifan A1 Tan, Chen A1 Liang, Shiwei PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 6 SP 3172 OP 3178 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3264529 DO https://doi.org/10.1109/ted.2023.3264529 SF ELIB - SuUB Bremen
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