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1 Ergebnisse
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Investigation of Endurance Degradation Mechanism of Si FeFE..:
Shao, Xianzhou
;
Chai, Junshuai
;
Tian, Fengbin
...
IEEE Transactions on Electron Devices. 70 (2023) 6 - p. 3043-3050 , 2023
Link:
https://doi.org/10.1109/ted.2023.3265913
RT Journal T1 <Title>Investigation of Endurance Degradation Mechanism of Si FeFET With HfZrO Ferroelectric by an In Situ Vth Measurement</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3265913&Exemplar=1&LAN=DE A1 Shao, Xianzhou A1 Chai, Junshuai A1 Tian, Fengbin A1 Zhao, Shujing A1 Duan, Jiahui A1 Ke, Xiaoyu A1 Sun, Xiaoqing A1 Xiang, Jinjuan A1 Han, Kai A1 Wang, Yanrong A1 Xu, Hao A1 Wang, Xiaolei A1 Zhang, Jing A1 Wang, Wenwu A1 Ye, Tianchun PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 6 SP 3043 OP 3050 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3265913 DO https://doi.org/10.1109/ted.2023.3265913 SF ELIB - SuUB Bremen
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