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1 Ergebnisse
1
Low-Frequency and Random Telegraph Noise in 14-nm Bulk Si C..:
Gorchichko, Mariia
;
Zhang, En Xia
;
Reaz, Mahmud
...
IEEE Transactions on Electron Devices. 70 (2023) 6 - p. 3215-3222 , 2023
Link:
https://doi.org/10.1109/ted.2023.3265939
RT Journal T1
Low-Frequency and Random Telegraph Noise in 14-nm Bulk Si Charge-Trap Transistors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3265939&Exemplar=1&LAN=DE A1 Gorchichko, Mariia A1 Zhang, En Xia A1 Reaz, Mahmud A1 Li, Kan A1 Wang, Peng Fei A1 Cao, Jingchen A1 Brewer, Rachel M. A1 Schrimpf, Ronald D. A1 Reed, Robert A. A1 Sierawski, Brian D. A1 Alles, Michael L. A1 Cox, Jonathan A1 Moran, Steven L. A1 Iyer, Subramanian S. A1 Fleetwood, Daniel M. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 6 SP 3215 OP 3222 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3265939 DO https://doi.org/10.1109/ted.2023.3265939 SF ELIB - SuUB Bremen
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