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1 Ergebnisse
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Performance Enhancement of AlGaN/GaN HEMT via Trap-State Im..:
Amir, Walid
;
Shin, Ju-Won
;
Shin, Ki-Yong
...
IEEE Transactions on Electron Devices. 70 (2023) 6 - p. 2988-2993 , 2023
Link:
https://doi.org/10.1109/ted.2023.3268626
RT Journal T1 <Title>Performance Enhancement of AlGaN/GaN HEMT via Trap-State Improvement Using O2 Plasma Treatment</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3268626&Exemplar=1&LAN=DE A1 Amir, Walid A1 Shin, Ju-Won A1 Shin, Ki-Yong A1 Chakraborty, Surajit A1 Cho, Chu-Young A1 Kim, Jae-Moo A1 Lee, Sang-Tae A1 Hoshi, Takuya A1 Tsutsumi, Takuya A1 Sugiyama, Hiroki A1 Matsuzaki, Hideaki A1 Kim, Dae-Hyun A1 Kim, Tae-Woo PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 6 SP 2988 OP 2993 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3268626 DO https://doi.org/10.1109/ted.2023.3268626 SF ELIB - SuUB Bremen
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