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Degradation of VDMOS Under Simultaneous and Sequential Stre..:

Li, Xinyu ; Jia, Yunpeng ; Zhou, Xintian...
IEEE Transactions on Electron Devices.  70 (2023)  6 - p. 2947-2955 , 2023
Link: https://doi.org/10.1109/ted.2023.3269408