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1 Ergebnisse
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Abnormal Two-Stage Degradation Under Hot Carrier Injection ..:
Hung, Wei-Chun
;
Tu, Yu-Fa
;
Chang, Ting-Chang
...
IEEE Transactions on Electron Devices. 70 (2023) 7 - p. 3419-3423 , 2023
Link:
https://doi.org/10.1109/ted.2023.3276734
RT Journal T1 <Title>Abnormal Two-Stage Degradation Under Hot Carrier Injection With Lateral Double-Diffused MOS With 0.13-μm Bipolar-CMOS-DMOS Technology</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3276734&Exemplar=1&LAN=DE A1 Hung, Wei-Chun A1 Tu, Yu-Fa A1 Chang, Ting-Chang A1 Tai, Mao-Chou A1 Chen, Kuan-Hsu A1 Jin, Fu-Yuan A1 Yeh, Chien-Hung A1 Hung, Wei-Chieh A1 Chang, Chin-Han A1 Kuo, Hung-Ming A1 Lien, Chen-Hsin PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 7 SP 3419 OP 3423 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3276734 DO https://doi.org/10.1109/ted.2023.3276734 SF ELIB - SuUB Bremen
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