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1 Ergebnisse
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Temperature-Dependent Dynamic Ron of GaN E-HEMTs: The Impac..:
Li, Shaocheng
;
Sheng, Kuang
;
Yang, Shu
IEEE Transactions on Electron Devices. 70 (2023) 7 - p. 3754-3761 , 2023
Link:
https://doi.org/10.1109/ted.2023.3280150
RT Journal T1 <Title>Temperature-Dependent Dynamic Ron of GaN E-HEMTs: The Impact of p-GaN Drain</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3280150&Exemplar=1&LAN=DE A1 Li, Shaocheng A1 Sheng, Kuang A1 Yang, Shu PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 7 SP 3754 OP 3761 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3280150 DO https://doi.org/10.1109/ted.2023.3280150 SF ELIB - SuUB Bremen
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