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1 Ergebnisse
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A Surface Potential Based Full-Region Current Model for Dop..:
Zhang, Fangxing
;
Li, Hao
;
Wang, Kaifeng
...
IEEE Transactions on Electron Devices. 71 (2024) 1 - p. 46-53 , 2024
Link:
https://doi.org/10.1109/ted.2023.3282195
RT Journal T1 <Title>A Surface Potential Based Full-Region Current Model for Doping Segregated TFETs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3282195&Exemplar=1&LAN=DE A1 Zhang, Fangxing A1 Li, Hao A1 Wang, Kaifeng A1 Dai, Wu A1 Jiao, Yanxin A1 Ding, Feilong A1 Ren, Ye A1 Wu, Yongqin A1 Bu, Weihai A1 Huang, Qianqian A1 Zhang, Lining A1 Huang, Ru PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 1 SP 46 OP 53 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3282195 DO https://doi.org/10.1109/ted.2023.3282195 SF ELIB - SuUB Bremen
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