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Nonconducting RF and DC Hot Carrier Stresses in 14/16-nm Fi..:

Ding, Xuewei ; Niu, Guofu ; Zhang, Huilong...
IEEE Transactions on Electron Devices.  70 (2023)  8 - p. 4028-4035 , 2023
Link: https://doi.org/10.1109/ted.2023.3282913