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1 Ergebnisse
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Enhanced Stability of SiZTO TFT Under Positive Voltage and ..:
Huang, Chuanxin
;
Ma, Dianguo
;
Guo, Zhongkai
...
IEEE Transactions on Electron Devices. 70 (2023) 8 - p. 4213-4219 , 2023
Link:
https://doi.org/10.1109/ted.2023.3288502
RT Journal T1 <Title>Enhanced Stability of SiZTO TFT Under Positive Voltage and Light Negative Voltage Stress and Modified Hysteresis of the CNTs/SiZTO CMOS Inverter by Si Doping</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3288502&Exemplar=1&LAN=DE A1 Huang, Chuanxin A1 Ma, Dianguo A1 Guo, Zhongkai A1 Yao, Haiyun A1 Lv, Kaikai A1 Tian, Zhongjun A1 Liang, Lanju A1 Gao, Ju A1 Liu, Yunyun A1 Ding, Xingwei PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 8 SP 4213 OP 4219 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3288502 DO https://doi.org/10.1109/ted.2023.3288502 SF ELIB - SuUB Bremen
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