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1 Ergebnisse
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A 144-fJ/Bit Reliable and Compact TRNG Based on the Diffusi..:
Li, Xiaoran
;
Wang, Yiming
;
Yang, Yiming
...
IEEE Transactions on Electron Devices. 70 (2023) 8 - p. 4139-4144 , 2023
Link:
https://doi.org/10.1109/ted.2023.3288839
RT Journal T1 <Title>A 144-fJ/Bit Reliable and Compact TRNG Based on the Diffusive Resistance of 3-D Resistive Random Access Memory</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3288839&Exemplar=1&LAN=DE A1 Li, Xiaoran A1 Wang, Yiming A1 Yang, Yiming A1 Lv, Shidong A1 Luo, Qing A1 Wang, Xinghua A1 Xu, Xiaoxin A1 Lei, Dengyun A1 Zhang, Feng PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 8 SP 4139 OP 4144 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3288839 DO https://doi.org/10.1109/ted.2023.3288839 SF ELIB - SuUB Bremen
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