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1 Ergebnisse
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Optimization of Process Parameters on Short-Term Retention ..:
Jang, Hyundong
;
Nam, Kihoon
;
Yun, Hyeok
...
IEEE Transactions on Electron Devices. 70 (2023) 8 - p. 4157-4162 , 2023
Link:
https://doi.org/10.1109/ted.2023.3288840
RT Journal T1 <Title>Optimization of Process Parameters on Short-Term Retention for Charge-Trapping 3-D NAND Flash Memories Using Novel Neural Networks Approach</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3288840&Exemplar=1&LAN=DE A1 Jang, Hyundong A1 Nam, Kihoon A1 Yun, Hyeok A1 Cho, Kyeongrae A1 Eom, Seungjoon A1 Park, Min Sang A1 Baek, Rock-Hyun PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 8 SP 4157 OP 4162 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3288840 DO https://doi.org/10.1109/ted.2023.3288840 SF ELIB - SuUB Bremen
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