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1 Ergebnisse
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Impact of Current on the Parallel Resistance and Junction C..:
Zhong, Chenming
;
Lu, Yijun
;
Fan, Xiaotong
...
IEEE Transactions on Electron Devices. 71 (2024) 1 - p. 316-321 , 2024
Link:
https://doi.org/10.1109/ted.2023.3296072
RT Journal T1 <Title>Impact of Current on the Parallel Resistance and Junction Capacitance of Light-Emitting Diodes</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3296072&Exemplar=1&LAN=DE A1 Zhong, Chenming A1 Lu, Yijun A1 Fan, Xiaotong A1 Chen, Guolong A1 Gao, Yulin A1 Zhu, Lihong A1 Wang, Yong A1 Zhao, Lihong A1 Yang, Sihua A1 Wang, Liqiang A1 Chen, Zhong A1 Guo, Weijie PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 1 SP 316 OP 321 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3296072 DO https://doi.org/10.1109/ted.2023.3296072 SF ELIB - SuUB Bremen
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