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1 Ergebnisse
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Annealing Ambient and Film Thickness Dependent NO2 Response..:
Shin, Wonjun
;
Koo, Ryun-Han
;
Hong, Seongbin
...
IEEE Transactions on Electron Devices. 70 (2023) 10 - p. 5475-5478 , 2023
Link:
https://doi.org/10.1109/ted.2023.3303122
RT Journal T1 <Title>Annealing Ambient and Film Thickness Dependent NO2 Response and 1/f Noise Characteristics of IGZO Resistor-Type Gas Sensors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3303122&Exemplar=1&LAN=DE A1 Shin, Wonjun A1 Koo, Ryun-Han A1 Hong, Seongbin A1 Jeong, Yujeong A1 Jung, Gyuweon A1 Lee, Sung-Tae A1 Lee, Jong-Ho PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 10 SP 5475 OP 5478 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3303122 DO https://doi.org/10.1109/ted.2023.3303122 SF ELIB - SuUB Bremen
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