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Role of the GaN-on-Si Epi-Stack on ΔRON Caused by Back-Gati..:

Millesimo, M. ; Borga, M. ; Valentini, L....
IEEE Transactions on Electron Devices.  70 (2023)  10 - p. 5203-5209 , 2023
Link: https://doi.org/10.1109/ted.2023.3304272