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1 Ergebnisse
1
Analysis of Thermal Resistance Considering Self-Heating Eff..:
Xing, Qian
;
Su, Yali
;
Bu, Jianhui
.
IEEE Transactions on Electron Devices. 70 (2023) 10 - p. 5014-5021 , 2023
Link:
https://doi.org/10.1109/ted.2023.3308085
RT Journal T1 <Title>Analysis of Thermal Resistance Considering Self-Heating Effects and Ambient Temperature Coupling for Double-SOI MOSFETs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3308085&Exemplar=1&LAN=DE A1 Xing, Qian A1 Su, Yali A1 Bu, Jianhui A1 Zhang, Guohe PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 10 SP 5014 OP 5021 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3308085 DO https://doi.org/10.1109/ted.2023.3308085 SF ELIB - SuUB Bremen
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