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1 Ergebnisse
1
Improvement of Electrical Characteristics and Stability in ..:
Zhao, Han-Lin
;
Shan, Fei
;
Wang, Xiao-Lin
...
IEEE Transactions on Electron Devices. 70 (2023) 12 - p. 6354-6358 , 2023
Link:
https://doi.org/10.1109/ted.2023.3324899
RT Journal T1 <Title>Improvement of Electrical Characteristics and Stability in Low-Voltage Indium Oxide Thin-Film Transistors by Using Tungsten Doping</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3324899&Exemplar=1&LAN=DE A1 Zhao, Han-Lin A1 Shan, Fei A1 Wang, Xiao-Lin A1 Tarsoly, Gergely A1 Lee, Jae-Yun A1 Kim, Sung-Jin PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 12 SP 6354 OP 6358 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3324899 DO https://doi.org/10.1109/ted.2023.3324899 SF ELIB - SuUB Bremen
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