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1 Ergebnisse
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Investigation of Bending-Induced Degradation of Flexible Al..:
Wang, Yan
;
Zheng, Wenhao
;
Mao, Shuman
...
IEEE Transactions on Electron Devices. 70 (2023) 12 - p. 6231-6236 , 2023
Link:
https://doi.org/10.1109/ted.2023.3325794
RT Journal T1 <Title>Investigation of Bending-Induced Degradation of Flexible AlGaN/GaN HEMTs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3325794&Exemplar=1&LAN=DE A1 Wang, Yan A1 Zheng, Wenhao A1 Mao, Shuman A1 Yan, Bo A1 Wu, Qingzhi A1 Xu, Yuehang PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 12 SP 6231 OP 6236 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3325794 DO https://doi.org/10.1109/ted.2023.3325794 SF ELIB - SuUB Bremen
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