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1 Ergebnisse
1
Comprehensive Study of Contact Length Scaling Down to 12 nm..:
Wu, Wen-Chia
;
Hung, Terry Y. T.
;
Sathaiya, D. Mahaveer
...
IEEE Transactions on Electron Devices. 70 (2023) 12 - p. 6680-6686 , 2023
Link:
https://doi.org/10.1109/ted.2023.3330461
RT Journal T1
Comprehensive Study of Contact Length Scaling Down to 12 nm With Monolayer MoS2 Channel Transistors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3330461&Exemplar=1&LAN=DE A1 Wu, Wen-Chia A1 Hung, Terry Y. T. A1 Sathaiya, D. Mahaveer A1 Arutchelvan, Goutham A1 Hsu, Chen-Feng A1 Su, Sheng-Kai A1 Chou, Ang Sheng A1 Chen, Edward A1 Shen, Yun-Yang A1 Liew, San Lin A1 Hou, Vincent A1 Lee, T. Y. A1 Cai, Jin A1 Wu, Chung-Cheng A1 Wu, Jeff A1 Wong, H.-S. Philip A1 Cheng, Chao-Ching A1 Chang, Wen-Hao A1 Radu, Iuliana P. A1 Chien, Chao-Hsin PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 70 IS 12 SP 6680 OP 6686 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3330461 DO https://doi.org/10.1109/ted.2023.3330461 SF ELIB - SuUB Bremen
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