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1 Ergebnisse
1
Correlating Interface and Border Traps With Distinctive Fea..:
Zagni, Nicolò
;
Fregolent, Manuel
;
Verzellesi, Giovanni
...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 1561-1566 , 2024
Link:
https://doi.org/10.1109/ted.2023.3335032
RT Journal T1
Correlating Interface and Border Traps With Distinctive Features of C–V Curves in Vertical Al2O3/GaN MOS Capacitors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3335032&Exemplar=1&LAN=DE A1 Zagni, Nicolò A1 Fregolent, Manuel A1 Verzellesi, Giovanni A1 Marcuzzi, Alberto A1 De Santi, Carlo A1 Meneghesso, Gaudenzio A1 Zanoni, Enrico A1 Treidel, Eldad Bahat A1 Brusaterra, Enrico A1 Brunner, Frank A1 Hilt, Oliver A1 Meneghini, Matteo A1 Pavan, Paolo PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 3 SP 1561 OP 1566 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3335032 DO https://doi.org/10.1109/ted.2023.3335032 SF ELIB - SuUB Bremen
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