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1 Ergebnisse
1
Defect Behavior on the Degradation of AlGaN-Based 234 nm LE..:
Li, Min
;
Su, Mengwei
;
Chen, Zhiqiang
...
IEEE Transactions on Electron Devices. 71 (2024) 2 - p. 1102-1108 , 2024
Link:
https://doi.org/10.1109/ted.2023.3335039
RT Journal T1
Defect Behavior on the Degradation of AlGaN-Based 234 nm LEDs
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3335039&Exemplar=1&LAN=DE A1 Li, Min A1 Su, Mengwei A1 Chen, Zhiqiang A1 Deng, Shaodong A1 Zhu, Xinglin A1 Zheng, Gang A1 Yang, Yufei A1 Wu, Wei A1 Deng, Jianyu A1 Sun, Wenhong PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 2 SP 1102 OP 1108 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3335039 DO https://doi.org/10.1109/ted.2023.3335039 SF ELIB - SuUB Bremen
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