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Defect Behavior on the Degradation of AlGaN-Based 234 nm LE..:

Li, Min ; Su, Mengwei ; Chen, Zhiqiang...
IEEE Transactions on Electron Devices.  71 (2024)  2 - p. 1102-1108 , 2024
Link: https://doi.org/10.1109/ted.2023.3335039