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1 Ergebnisse
1
Insight Into Electromigration Reliability of Buried Power R..:
Cai, Linlin
;
Chen, Yutao
;
Zhang, Haoyu
..
IEEE Transactions on Electron Devices. 71 (2024) 1 - p. 418-424 , 2024
Link:
https://doi.org/10.1109/ted.2023.3336275
RT Journal T1 <Title>Insight Into Electromigration Reliability of Buried Power Rail With Alternative Metal Material</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3336275&Exemplar=1&LAN=DE A1 Cai, Linlin A1 Chen, Yutao A1 Zhang, Haoyu A1 Lin, Jianwen A1 Chen, Wangyong PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 1 SP 418 OP 424 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3336275 DO https://doi.org/10.1109/ted.2023.3336275 SF ELIB - SuUB Bremen
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