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1 Ergebnisse
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Degradation Mechanisms of Hydrogen-Terminated Diamond MISFE..:
Chen, Zhihao
;
Yu, Xinxin
;
Mao, Shuman
...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 2012-2017 , 2024
Link:
https://doi.org/10.1109/ted.2023.3339082
RT Journal T1 <Title>Degradation Mechanisms of Hydrogen-Terminated Diamond MISFETs Under Off-State Stress Conditions</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3339082&Exemplar=1&LAN=DE A1 Chen, Zhihao A1 Yu, Xinxin A1 Mao, Shuman A1 Zhou, Jianjun A1 Kong, Yuechan A1 Chen, Tangsheng A1 Xu, Ruimin A1 Yan, Bo A1 Xu, Yuehang PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 3 SP 2012 OP 2017 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3339082 DO https://doi.org/10.1109/ted.2023.3339082 SF ELIB - SuUB Bremen
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