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1 Ergebnisse
1
Characterization of Current Collapse and Enhancement of Hyd..:
Jia, Yonghao
;
Xu, Yuehang
;
Yu, Xinxin
...
IEEE Transactions on Electron Devices. 71 (2024) 2 - p. 971-975 , 2024
Link:
https://doi.org/10.1109/ted.2023.3344560
RT Journal T1 <Title>Characterization of Current Collapse and Enhancement of Hydrogen-Terminated Diamond MOSFET Due to Long-Term Trapping Effects</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3344560&Exemplar=1&LAN=DE A1 Jia, Yonghao A1 Xu, Yuehang A1 Yu, Xinxin A1 Chen, Zhihao A1 Fu, Yu A1 Zhou, Jianjun A1 Kong, Yuechan A1 Chen, Tangsheng A1 Lu, Wei-Bing PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 2 SP 971 OP 975 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3344560 DO https://doi.org/10.1109/ted.2023.3344560 SF ELIB - SuUB Bremen
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