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1 Ergebnisse
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Double Gated a-InGaZnO TFT Properties Based on Quantitative..:
Hong, Hyunmin
;
Yi, Dong-Joon
;
Moon, Yeon-Keon
...
IEEE Transactions on Electron Devices. 71 (2024) 2 - p. 1097-1101 , 2024
Link:
https://doi.org/10.1109/ted.2023.3347503
RT Journal T1
Double Gated a-InGaZnO TFT Properties Based on Quantitative Defect Analysis and Computational Modeling
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2023.3347503&Exemplar=1&LAN=DE A1 Hong, Hyunmin A1 Yi, Dong-Joon A1 Moon, Yeon-Keon A1 Son, Kyoung-Seok A1 Lim, Jun Hyung A1 Jeong, KwangSik A1 Chung, Kwun-Bum PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 2 SP 1097 OP 1101 LK http://dx.doi.org/https://doi.org/10.1109/ted.2023.3347503 DO https://doi.org/10.1109/ted.2023.3347503 SF ELIB - SuUB Bremen
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