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1 Ergebnisse
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Investigation of Charge Trapping Induced Trap Generation in..:
Jia, Xinpei
;
Chai, Junshuai
;
Duan, Jiahui
...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 1845-1851 , 2024
Link:
https://doi.org/10.1109/ted.2024.3351599
RT Journal T1 <Title>Investigation of Charge Trapping Induced Trap Generation in Si FeFET With Ferroelectric Hf0.5Zr0.5O2</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3351599&Exemplar=1&LAN=DE A1 Jia, Xinpei A1 Chai, Junshuai A1 Duan, Jiahui A1 Sun, Xiaoqing A1 Shao, Xianzhou A1 Xiang, Jinjuan A1 Han, Kai A1 Wang, Yanrong A1 Xu, Hao A1 Wang, Xiaolei A1 Zhang, Jing A1 Wang, Wenwu PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 3 SP 1845 OP 1851 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3351599 DO https://doi.org/10.1109/ted.2024.3351599 SF ELIB - SuUB Bremen
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