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1 Ergebnisse
1
Effect of High Temperature on the Performance of AlGaN/GaN ..:
Islam, Ahmad E.
;
Sepelak, Nicholas P.
;
Miesle, Adam T.
...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 1805-1811 , 2024
Link:
https://doi.org/10.1109/ted.2024.3353694
RT Journal T1
Effect of High Temperature on the Performance of AlGaN/GaN T-Gate High-Electron Mobility Transistors With ~140-nm Gate Length
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3353694&Exemplar=1&LAN=DE A1 Islam, Ahmad E. A1 Sepelak, Nicholas P. A1 Miesle, Adam T. A1 Lee, Hanwool A1 Snure, Michael A1 Nikodemski, Stefan A1 Walker, Dennis E. A1 Miller, Nicholas C. A1 Grupen, Matt A1 Leedy, Kevin D. A1 Liddy, Kyle J. A1 Crespo, Antonio A1 Hughes, Gary R. A1 Zhu, Wenjuan A1 Poling, Brian A1 Tetlak, Stephen A1 Chabak, Kelson D. A1 Green, Andrew J. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 3 SP 1805 OP 1811 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3353694 DO https://doi.org/10.1109/ted.2024.3353694 SF ELIB - SuUB Bremen
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