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1 Ergebnisse
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Design Technology Co-Optimization for the DRAM Cell Structu..:
Lee, Jaehyun
;
Asenov, Plamen
;
Rhyner, Reto
...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 1893-1899 , 2024
Link:
https://doi.org/10.1109/ted.2024.3357615
RT Journal T1 <Title>Design Technology Co-Optimization for the DRAM Cell Structure With Contact Resistance Variation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3357615&Exemplar=1&LAN=DE A1 Lee, Jaehyun A1 Asenov, Plamen A1 Rhyner, Reto A1 Kao, Ethan A1 Amoroso, Salvatore M. A1 Brown, Andrew R. A1 Lin, Xi-Wei A1 Moroz, Victor PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 3 SP 1893 OP 1899 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3357615 DO https://doi.org/10.1109/ted.2024.3357615 SF ELIB - SuUB Bremen
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