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1 Ergebnisse
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A Comprehensive Comparison of Different Wafer/Channel Orien..:
Zhao, Yusi
;
Xu, Zhongshan
;
Ding, Rongzheng
..
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 1784-1791 , 2024
Link:
https://doi.org/10.1109/ted.2024.3358790
RT Journal T1 <Title>A Comprehensive Comparison of Different Wafer/Channel Orientations for Ultrascaled Nanosheet FETs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3358790&Exemplar=1&LAN=DE A1 Zhao, Yusi A1 Xu, Zhongshan A1 Ding, Rongzheng A1 Zhao, Yage A1 Yu, Shaofeng PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 3 SP 1784 OP 1791 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3358790 DO https://doi.org/10.1109/ted.2024.3358790 SF ELIB - SuUB Bremen
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