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1 Ergebnisse
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Enhanced ON/OFF Ratio (4 × 105) and Robust Endurance (> 101..:
Jung, Laeyong
;
Oh, Seungyeol
;
Jang, Hojung
...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 2238-2242 , 2024
Link:
https://doi.org/10.1109/ted.2024.3360010
RT Journal T1 <Title>Enhanced ON/OFF Ratio (4 × 105) and Robust Endurance (> 1010) in an InGaZnO/HfxZr1-xO2 Ferroelectric Diode via Defect Engineering</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3360010&Exemplar=1&LAN=DE A1 Jung, Laeyong A1 Oh, Seungyeol A1 Jang, Hojung A1 Lee, Kyumin A1 Choi, Wooseok A1 Hwang, Hyunsang PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 3 SP 2238 OP 2242 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3360010 DO https://doi.org/10.1109/ted.2024.3360010 SF ELIB - SuUB Bremen
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