I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Analysis of the Thickness of Multilayered Porous Silicon in..:
Li, He
;
Sailei, Li
;
Wei, Luo
IEEE Transactions on Electron Devices. 71 (2024) 4 - p. 2645-2650 , 2024
Link:
https://doi.org/10.1109/ted.2024.3361840
RT Journal T1 <Title>Analysis of the Thickness of Multilayered Porous Silicon in the Cold Emission Property</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3361840&Exemplar=1&LAN=DE A1 Li, He A1 Sailei, Li A1 Wei, Luo PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 4 SP 2645 OP 2650 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3361840 DO https://doi.org/10.1109/ted.2024.3361840 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
