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1 Ergebnisse
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Large Memory Window Antifuse HfO₂-Based One-Resistor and On..:
Hsieh, Dong-Ru
;
Ni, Jia-Chian
;
Yeh, Wei-Ju
...
IEEE Transactions on Electron Devices. 71 (2024) 4 - p. 2824-2829 , 2024
Link:
https://doi.org/10.1109/ted.2024.3364577
RT Journal T1 <Title>Large Memory Window Antifuse HfO₂-Based One-Resistor and One-OTP NVMs Featuring Excellent Disturbance Tolerance and Robust 200 °C Retention</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3364577&Exemplar=1&LAN=DE A1 Hsieh, Dong-Ru A1 Ni, Jia-Chian A1 Yeh, Wei-Ju A1 Hong, Zi-Yang A1 Luo, Huai-En A1 Hsu, Michael A1 Cho, Ta-Chun A1 Chao, Tien-Sheng PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 4 SP 2824 OP 2829 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3364577 DO https://doi.org/10.1109/ted.2024.3364577 SF ELIB - SuUB Bremen
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