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Investigation of Threshold Voltage Instability of SiC MOSFE..:
Chen, Yuan
;
Rao, Yunliang
;
Wang, Mei
...
IEEE Transactions on Electron Devices. 71 (2024) 4 - p. 2536-2542 , 2024
Link:
https://doi.org/10.1109/ted.2024.3365776
RT Journal T1 <Title>Investigation of Threshold Voltage Instability of SiC MOSFETs Under Different Gate Voltage Sequences</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3365776&Exemplar=1&LAN=DE A1 Chen, Yuan A1 Rao, Yunliang A1 Wang, Mei A1 Gao, Rui A1 He, Zhiyuan A1 Chen, Yiqiang A1 Lai, Ping PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 4 SP 2536 OP 2542 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3365776 DO https://doi.org/10.1109/ted.2024.3365776 SF ELIB - SuUB Bremen
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