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1 Ergebnisse
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Comparative Investigation on the Repetitive Short-Circuit C..:
Li, Xiangdong
;
Wang, Meng
;
Wang, Hongyue
...
IEEE Transactions on Electron Devices. 71 (2024) 4 - p. 2550-2556 , 2024
Link:
https://doi.org/10.1109/ted.2024.3365780
RT Journal T1 <Title>Comparative Investigation on the Repetitive Short-Circuit Capability of 100 V Commercial p-GaN Gate Power HEMTs With Different Processing and Structure</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3365780&Exemplar=1&LAN=DE A1 Li, Xiangdong A1 Wang, Meng A1 Wang, Hongyue A1 Zhang, Jincheng A1 You, Shuzhen A1 Wang, Junbo A1 Han, Zhanfei A1 Yang, Weitao A1 Hao, Yue PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 4 SP 2550 OP 2556 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3365780 DO https://doi.org/10.1109/ted.2024.3365780 SF ELIB - SuUB Bremen
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