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1 Ergebnisse
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Surface Accumulation Induced Negative Schottky Barrier and ..:
Niu, Chang
;
Lin, Zehao
;
Askarpour, Vahid
...
IEEE Transactions on Electron Devices. 71 (2024) 5 - p. 3403-3410 , 2024
Link:
https://doi.org/10.1109/ted.2024.3367312
RT Journal T1 <Title>Surface Accumulation Induced Negative Schottky Barrier and Ultralow Contact Resistance in Atomic-Layer-Deposited In2O3 Thin-Film Transistors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3367312&Exemplar=1&LAN=DE A1 Niu, Chang A1 Lin, Zehao A1 Askarpour, Vahid A1 Zhang, Zhuocheng A1 Tan, Pukun A1 Si, Mengwei A1 Shang, Zhongxia A1 Zhang, Yizhi A1 Wang, Haiyan A1 Lundstrom, Mark S. A1 Maassen, Jesse A1 Ye, Peide D. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 5 SP 3403 OP 3410 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3367312 DO https://doi.org/10.1109/ted.2024.3367312 SF ELIB - SuUB Bremen
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