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1 Ergebnisse
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Experimental Analysis and Modeling of Self-Heating and Ther..:
Bergamaschi, Flávio Enrico
;
Frutuoso, Tadeu Mota
;
Paz, Bruna Cardoso
...
IEEE Transactions on Electron Devices. 71 (2024) 4 - p. 2598-2604 , 2024
Link:
https://doi.org/10.1109/ted.2024.3367316
RT Journal T1
Experimental Analysis and Modeling of Self-Heating and Thermal Coupling in 28 nm FD-SOI CMOS Transistors Down to Cryogenic Temperatures
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3367316&Exemplar=1&LAN=DE A1 Bergamaschi, Flávio Enrico A1 Frutuoso, Tadeu Mota A1 Paz, Bruna Cardoso A1 Billiot, Gérard A1 Jansen, Aloysius G. M. A1 Galy, Phillipe A1 Vincent, Emmanuel A1 Gaillard, Fred A1 Duriez, Blandine A1 Cassé, Mikaël PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 4 SP 2598 OP 2604 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3367316 DO https://doi.org/10.1109/ted.2024.3367316 SF ELIB - SuUB Bremen
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