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1 Ergebnisse
1
Extrinsic Degradation of Flexible Poly-Si Thin-Film Transis..:
Zhou, Wenjuan
;
Wang, Mingxiang
;
Zhang, Dongli
..
IEEE Transactions on Electron Devices. 71 (2024) 4 - p. 2452-2458 , 2024
Link:
https://doi.org/10.1109/ted.2024.3367830
RT Journal T1
Extrinsic Degradation of Flexible Poly-Si Thin-Film Transistors Under Dynamic Bending Stress
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3367830&Exemplar=1&LAN=DE A1 Zhou, Wenjuan A1 Wang, Mingxiang A1 Zhang, Dongli A1 Wang, Huaisheng A1 Shan, Qi PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 4 SP 2452 OP 2458 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3367830 DO https://doi.org/10.1109/ted.2024.3367830 SF ELIB - SuUB Bremen
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