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1 Ergebnisse
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Hydrogen-Related Instability of IGZO Field-Effect Transisto..:
Liu, Gan
;
Kong, Qiwen
;
Zhang, Dong
...
IEEE Transactions on Electron Devices. 71 (2024) 5 - p. 2995-3001 , 2024
Link:
https://doi.org/10.1109/ted.2024.3372486
RT Journal T1 <Title>Hydrogen-Related Instability of IGZO Field-Effect Transistors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3372486&Exemplar=1&LAN=DE A1 Liu, Gan A1 Kong, Qiwen A1 Zhang, Dong A1 Wang, Xiaolin A1 Zhou, Zuopu A1 Jiao, Leming A1 Han, Kaizhen A1 Kang, Yuye A1 Nguyen, Bich-Yen A1 Ni, Kai A1 Gong, Xiao PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 5 SP 2995 OP 3001 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3372486 DO https://doi.org/10.1109/ted.2024.3372486 SF ELIB - SuUB Bremen
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