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Analysis of Nanosheet Field-Effect Transistor With Local Bo..:
You, Jiwon
;
Kim, Hyunwoo
;
Kwon, Daewoong
IEEE Transactions on Electron Devices. 71 (2024) 5 - p. 2844-2848 , 2024
Link:
https://doi.org/10.1109/ted.2024.3373723
RT Journal T1 <Title>Analysis of Nanosheet Field-Effect Transistor With Local Bottom Isolation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3373723&Exemplar=1&LAN=DE A1 You, Jiwon A1 Kim, Hyunwoo A1 Kwon, Daewoong PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 5 SP 2844 OP 2848 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3373723 DO https://doi.org/10.1109/ted.2024.3373723 SF ELIB - SuUB Bremen
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