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1 Ergebnisse
1
Reverse Recovery Enhanced and Single-Event Effects Hardened..:
Yu, Qisheng
;
Chen, Wensuo
;
Zhang, Aohang
.
IEEE Transactions on Electron Devices. 71 (2024) 5 - p. 2888-2893 , 2024
Link:
https://doi.org/10.1109/ted.2024.3379156
RT Journal T1 <Title>Reverse Recovery Enhanced and Single-Event Effects Hardened Power Schottky Source MOSFET With Integrated Retrograde p-Well Schottky Contact Super Barrier Rectifier</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3379156&Exemplar=1&LAN=DE A1 Yu, Qisheng A1 Chen, Wensuo A1 Zhang, Aohang A1 Huang, Jiaweiwen PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 5 SP 2888 OP 2893 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3379156 DO https://doi.org/10.1109/ted.2024.3379156 SF ELIB - SuUB Bremen
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