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1 Ergebnisse
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Characterization and Modeling of Silicon-on-Insulator Later..:
Zhang, Yuanke
;
Chen, Yuefeng
;
Zhang, Yifang
...
IEEE Transactions on Electron Devices. 71 (2024) 6 - p. 3525-3531 , 2024
Link:
https://doi.org/10.1109/ted.2024.3384143
RT Journal T1 <Title>Characterization and Modeling of Silicon-on-Insulator Lateral Bipolar Junction Transistors at Liquid Helium Temperature</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3384143&Exemplar=1&LAN=DE A1 Zhang, Yuanke A1 Chen, Yuefeng A1 Zhang, Yifang A1 Qiu, Liling A1 Xu, Jun A1 Luo, Chao A1 Guo, Guoping PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 6 SP 3525 OP 3531 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3384143 DO https://doi.org/10.1109/ted.2024.3384143 SF ELIB - SuUB Bremen
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