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1 Ergebnisse
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Wide Temperature Range Modeling of Implanted Resistors Base..:
Yang, Wenhao
;
Sun, Yuyin
;
Qi, Mengnan
...
IEEE Transactions on Electron Devices. 71 (2024) 6 - p. 3575-3581 , 2024
Link:
https://doi.org/10.1109/ted.2024.3385382
RT Journal T1 <Title>Wide Temperature Range Modeling of Implanted Resistors Based on 4H-SiC CMOS Process</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3385382&Exemplar=1&LAN=DE A1 Yang, Wenhao A1 Sun, Yuyin A1 Qi, Mengnan A1 Tang, Zhenyu A1 Mao, Shasha A1 Yuan, Lei A1 Sun, Lejia A1 Zhang, Yimeng A1 Zhang, Yuming PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 6 SP 3575 OP 3581 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3385382 DO https://doi.org/10.1109/ted.2024.3385382 SF ELIB - SuUB Bremen
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