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Ruggedness of Silicon Power MOSFETs—Part I: Cell Structure ..:
Tambone, R.
;
Ferrara, A.
;
Siemieniec, R.
...
IEEE Transactions on Electron Devices. 71 (2024) 6 - p. 3445-3457 , 2024
Link:
https://doi.org/10.1109/ted.2024.3394452
RT Journal T1 <Title>Ruggedness of Silicon Power MOSFETs—Part I: Cell Structure Design Related Failure: A Review</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3394452&Exemplar=1&LAN=DE A1 Tambone, R. A1 Ferrara, A. A1 Siemieniec, R. A1 Wood, A. A1 Magrini, F. A1 Hueting, R. J. E. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 6 SP 3445 OP 3457 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3394452 DO https://doi.org/10.1109/ted.2024.3394452 SF ELIB - SuUB Bremen
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