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1 Ergebnisse
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Dynamic Degradation of Planar-Gate SiC MOSFETs After Total ..:
Liang, Shiwei
;
Shu, Lei
;
Wang, Jun
..
IEEE Transactions on Electron Devices. 71 (2024) 7 - p. 4079-4086 , 2024
Link:
https://doi.org/10.1109/ted.2024.3398598
RT Journal T1 <Title>Dynamic Degradation of Planar-Gate SiC MOSFETs After Total Ionizing Dose Radiation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3398598&Exemplar=1&LAN=DE A1 Liang, Shiwei A1 Shu, Lei A1 Wang, Jun A1 Deng, Gaoqiang A1 Wang, Liang PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 7 SP 4079 OP 4086 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3398598 DO https://doi.org/10.1109/ted.2024.3398598 SF ELIB - SuUB Bremen
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