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1 Ergebnisse
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Investigation on Robust Avalanche Capacity of Super-Junctio..:
Li, Luping
;
Li, Zehong
;
Wu, Yuzhou
...
IEEE Transactions on Electron Devices. 71 (2024) 8 - p. 4853-4859 , 2024
Link:
https://doi.org/10.1109/ted.2024.3408774
RT Journal T1 <Title>Investigation on Robust Avalanche Capacity of Super-Junction IGBT Under UIS Stress</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3408774&Exemplar=1&LAN=DE A1 Li, Luping A1 Li, Zehong A1 Wu, Yuzhou A1 Chen, Peng A1 Rao, Qiansheng A1 Yang, Yuanzhen A1 Xiao, Fuyuan A1 Qin, Haifeng A1 Wan, Li A1 Li, Wei A1 Ren, Min A1 Zhang, Bo PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 8 SP 4853 OP 4859 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3408774 DO https://doi.org/10.1109/ted.2024.3408774 SF ELIB - SuUB Bremen
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