I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Role of Nitrogen in Suppressing Interfacial States Generati..:
Dai, Saifei
;
Li, Songwei
;
Xu, Shuangshuang
...
IEEE Transactions on Electron Devices. 71 (2024) 8 - p. 5081-5088 , 2024
Link:
https://doi.org/10.1109/ted.2024.3409203
RT Journal T1 <Title>Role of Nitrogen in Suppressing Interfacial States Generation and Improving Endurance in Ferroelectric Field-Effect Transistors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_ted.2024.3409203&Exemplar=1&LAN=DE A1 Dai, Saifei A1 Li, Songwei A1 Xu, Shuangshuang A1 Tian, Fengbin A1 Chai, Junshuai A1 Duan, Jiahui A1 Xiong, Wenjuan A1 Xiang, Jinjuan A1 Han, Kai A1 Wang, Yanrong A1 Xu, Hao A1 Zhang, Jing A1 Wang, Xiaolei A1 Wang, Wenwu PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9383 SN 1557-9646 JF IEEE Transactions on Electron Devices VO 71 IS 8 SP 5081 OP 5088 LK http://dx.doi.org/https://doi.org/10.1109/ted.2024.3409203 DO https://doi.org/10.1109/ted.2024.3409203 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
